Used HITACHI NX 2000 #293622849 for sale

HITACHI NX 2000 is a scanning electron microscope (SEM) designed to offer advanced imaging, exceptional throughput, and high sample throughput. This SEM will allow users to observe surface morphology and microstructure of samples that range from nanoscale to hundreds of micrometers. It is especially advantageous for inspecting semiconductor wafers, for instance. This electron microscope has many advantageous features which include a variety of imaging, analytical and measurement capabilities, high-resolution capabilities, and a large working distance for long-term observations. The large working distance allows for the observation of larger samples and the exchange of components if needed. This machine also provides a wide range of magnification from 100,000X to 1,000,000X. Furthermore, this scanning electron microscope is an ultra-high vacuum device which ensures a contamination-free environment during measurements. Additionally, this instrument offers a high performance detector with an excellent signal-to-noise ratio and sensitivity. This will enable the user to acquire quickly more accurate, detailed images. This microscope is equipped with a high-resolution digital imaging system. The system provides users with various image capture modes and image processing capabilities. This unit is also capable of automated analysis software that can identify certain characteristics of samples, including thickness and particle defects. The user interface designed in NX 2000 offers a simple computer controlled platform that enables the user to set up operations quickly for routine tasks. This unit also provides easy access to controls and settings for customizing the desired experiment. HITACHI NX 2000 is one of the most advanced models of scanning electron microscopes available, and is a great tool for researchers and industry professionals in the field of materials science. This unit will give an accurate, detailed view of the micro-structures of materials that would not be visible with other electron microscopes. The real-time interactive environment of NX 2000 will further enable an efficient and timely investigation of the surface morphology and micro-structure of the samples.