Used HITACHI RS-3000 #9026254 for sale

HITACHI RS-3000 is a state-of-the-art scanning electron microscope (SEM) designed to provide users with a powerful tool for imaging and analyzing small structures, particles, and surfaces. The equipment uses a high resolution electron beam to allow for topographical images of samples at magnifications up to 100,000x. The microscope is equipped with a range of independent secondary and backscattered electron detectors to allow for the most accurate analysis of sample structures. HITACHI unique Structured Illumination System (SIL) enhances images by allowing the electron beam to be scanned in a pseudo-3D pattern. This creates a range of azimuthal angles around a sample, creating views that make crystal structures, grain boundaries, and interfaces between phases visible. The SIL unit was specifically designed to allow for near atomic-level imaging on extended samples, making imaging of single particles or sample areas possible without alterations to the sample. HITACHI RS 3000 also features an on-board time-of-flight secondary ion mass spectrometer (TOF-SIMS) for surface characterization. The TOF-SIMS allows for true 3D ion mapping of surfaces with sub-nanometer resolution, enabling users to obtain detailed information on the chemical composition of sample surfaces. The machine includes a range of powerful automation features, making it an ideal choice for both Sophisticated R&D labs and numerous industrial applications. The automated tool eliminates user fatigue while streamlining the data collection process. In addition, the intuitive controller screen makes it easy to control the SEM and access advanced features. RS-3000 Scanning Electron Microscope offers a comprehensive set of features for imaging, analyzing, and characterizing small particles, making it an ideal choice for sample analysis and research. Its sophisticated imaging and spectroscopic capabilities, combined with its automated features, make it an excellent choice for scientific research and industrial applications.