Used HITACHI RS-3000 #9236189 for sale

HITACHI RS-3000 scanning electron microscope (SEM) is a versatile, powerful tool for imaging and analysis. It consists of an electron column, a specimen chamber, and an electronic control unit. The electron column generates beams of electrons that are accelerated and focused onto a sample, allowing for high resolution imaging. The specimen chamber is an environmental chamber that enables the manipulation of environmental parameters such as temperature and pressure, allowing for a range of sample analyses. The control unit provides the user with access to a variety of image and analysis functions, including image and data acquisition, signal or current monitoring, and imaging quality control. The electron column of the SEM generates a beam of electrons, which is then focused onto the sample using a set of condensers and objective lenses. The accelerating voltage of the electron beam, which ranges from 0.5 to 30 kV depending on the model, determines the resolution of the imaging. The sample is also scanned in a raster pattern to create a two dimensional image. Since the electron beam can penetrate the sample, the SEM is particularly useful for studying the internal structure of a material. The scanning process of the SEM is mainly automated, making it easy to use and efficient for multiple sample analysis. During imaging, the SEM is equipped with automated specimen manipulation functions such as surface Z-axis scan and tilt scan. These functions allow images of the same sample from different angles and with different depth profiles to be obtained. Additionally, the SEM can perform a variety of automated measurements such as area, length or surface area measurements based on the image obtained. HITACHI RS 3000 is also capable of image processing and analysis, allowing the user to manipulate and analyze the data obtained. The SEM is equipped with both bright and darkfield detectors that are used to enhance the images. Additionally, a variety of elemental analyses such as energy dispersive X-ray analysis (EDX) and X-ray mapping can be used to provide data on the elemental composition of a material. RS-3000 is a high performance SEM that offers a wide range of imaging, analysis, and image processing capabilities. Its automated functions provide a reliable and efficient platform for imaging and specimen analysis, making it an excellent tool for a variety of scientific and industrial applications. With its range of capabilities and automated functions, RS 3000 is an excellent option for those looking for a high performance SEM.