Used HITACHI RS-5000 #9108739 for sale

HITACHI RS-5000 scanning electron microscope (SEM) is a sophisticated instrument capable of measuring and imaging nanoscopic features in three-dimensional detail. The instrument employs electrons rather than visible light to scan the surface of small specimens with unprecedented accuracy and resolution. The outcome of an SEM scan is a direct digital representation of the specimen's topography, allowing for a detailed analysis of features that would be invisible to the naked eye or a light microscope. The major components of HITACHI RS 5000 are the electron source, the sample stage, an electron detector, and the computer control system. The electron source, a field emission gun, is the central piece of the instrument, and produces a beam of electrons that is focused onto the surface of the sample. The energy of the beam is precisely regulated and monitored, ensuring that the specimen isn't damaged during the scan. The sample stage is the focal point for the electron beam. It enables the user to rotate and move the sample, thereby controlling the scanning process. An electron detector gathers information about the beam-sample interactions and transmits the data to the computer control system. The application software allows users to select from a range of imaging and analysis modes, such as backscatter, secondary electron, polarization contrast, and 3D topography. These modes capture topographical features with a resolution that is measured in nanometers—bridging the gap between a light microscope and the nanometer-scale components of modern materials science. The research capabilities of RS-5000 SEM are vast. It allows scientists and engineers to analyze the properties of a sample in extreme detail. This includes a wide array of applications such as component metrology, defect analysis, surface analytics, depth profiling, and metallographic analysis. RS 5000 SEM is a powerful but user-friendly instrument that is well-suited for advanced research-level applications. Its combination of high resolution and flexibility make it a valuable tool for the rapid evaluation of a variety of samples. With its reliable performance and comprehensive user control, it continues to be one of the world's premier scanning electron microscopes.