Used HITACHI RS6000E #293668227 for sale

HITACHI RS6000E
ID: 293668227
Defect Review Scanning Electron Microscope (DR-SEM).
HITACHI RS6000E is a scanning electron microscope (SEM) that is well-suited for a wide variety of materials characterization needs. It utilizes a high-resolution glycol cooled field emission electron gun, which is capable of producing a deflection voltage of up to 30kV. Additionally, the equipment can achieve resolutions of down to 0.1 nm, which is especially useful for the analysis of nanoscale structures like thin films, nanoparticles, and other nanomaterials. RS6000E is equipped with a variety of detectors, including secondary electron, backscattered electron, and X-ray detectors. The SEM can generate a variety of images, such as secondary electron imaging, backscattered electron imaging, and X-ray elemental mapping. This enables the system to accurately measure materials properties, such as surface topography, elemental composition, and crystallinity. Additionally, the unit is also capable of performing micro-spectroscopy and other advanced analyses. HITACHI RS6000E is also equipped with the latest automatic image recording and analysis software packages, which are designed to provide the user with complete control over the analysis process. Software packages such as e-View, SEMTK, and SPMSt applications can be utilized to control the microscope parameters and to review and analyze the data generated. The software also allows for the automatic alignment of images, which results in higher quality analysis. Finally, RS6000E incorporates a number of features that ensure precise results in a range of surface operations. It includes hot or cold stages that enable the user to prepare samples for analysis, fields of view that can be up to 3.5 mm, and an integrated motorized zoom which allows for full-field imaging. The machine is also fitted with a fully motorized specimen exchange turret to enable easy specimen manipulation. In conclusion, HITACHI RS6000E is a high-tech scanning electron microscope that is ideal for a wide range of materials characterization needs. It is fitted with powerful detectors, advanced software packages, and a range of features that ensure precise results. This makes it the perfect tool for highly accurate analysis and increased accuracy in a range of surface operations.
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