Used HITACHI S-2300 #165214 for sale
It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.
Tap to zoom
Sold
ID: 165214
SEM
Resolution: 4.6 nm
Accelerating voltage: 0.5 to 25 kV (selectable in 35 steps)
Magnification: 20 to 200,000x
Maximum specimen diameter: 150mm
Specimen goniometer stage:
Noneucentric:
X: 80mm
Y: 40mm
R: 360°
T: -20° to 90°
Z: 30mm
Super eucentric:
X: 32mm
Y: 32mm
R: 360°
T: -90° to 90°
Z: 30mm
Automatic control: brightness / contrast, focusing, astimatism correction
Memory function: magnification presetting (desired 2 points), accelerating voltage memory, specimen position memory
Signal processing: Gamma control
Image display and recording: commercial TV scan, slow scan (4 steps), reduced area scan, waveform, photo scan (3 steps), twin photo, automatic data display
Configuration:
Column unit
Display
Oil rotary pump
Auto transformer
Standard tools
Spares and consumables
Instruction manual.
HITACHI S-2300 scanning electron microscope (SEM) is a high-performance, state-of-the-art imaging system for the investigation of a wide range of materials and applications. It is a scanning electron microscope that combines a high degree of automation with exceptional imaging capability. S-2300 SEM is the highest resolution tool in its class and is used in a number of different applications such as materials analysis, failure analysis, surface imaging and 3D imaging. HITACHI S-2300 uses a hybrid type scanning electron column with a large diameter source consisting of a heated tungsten filament for integration with a high-precision stage. This ensures that any scanned area is quickly and accurately delivered in high resolution and high contrast. It is also equipped with a comprehensive Traveling Magnetic Field (TMF) detector that increases the signal-to-noise ratio while at the same time reducing the range of accelerating voltage. This technology allows for better imaging of non-conductive samples which are not typically detected by traditional electron detectors. In addition to its scanning capabilities, S-2300 offers a wide range of features for the advanced application of electron beam imaging. Its high vacuum performance supports the use of high accelerating voltage for the imaging of crystalline structures. This allows for the imaging of sub-micron-sized features and see internal structures down to the atomic level. 3D autofocus can be used to adjust the focus without operator intervention, while automated stage control and microscope auto-calibration allow an uncontaminated imaging of even the most precise samples. HITACHI S-2300 also has an alignment system that allows it to detect any misalignment between sample and detector. This can provide rapid feedback on the accuracy of sample placement and can be used to correct any disproportions in the image. It also incorporates a range of software packages that provide advanced analytical options such as particle analysis, digital image processing and 3D views. S-2300 is a highly capable microscope for materials analysis and image processing and is suitable for a wide range of applications in research and industry. By combining advanced technology with high performance and outstanding imaging resolution, HITACHI S-2300 offers a unique level of precision and control for applications requiring the highest degree of detail and accuracy.
There are no reviews yet