Used HITACHI S-2300 #9080004 for sale

HITACHI S-2300 is a scanning electron microscope (SEM) used in a variety of fields for microscopic imaging and analysis. The SEM is an analytical tool capable of probing and characterizing the surface of samples down to the nanometer scale. With this microscope, compositional, morphological, and structural information can be obtained from a variety of materials. S-2300 possesses versatile features key to high-resolution SEM imaging. It runs on a thermionic, field emission gun (FEG) which provides a high-quality signal with increased thermal stability and higher stability current. Its Everhigh™ Detector System is capable of detecting both backscattered electrons and secondary electrons. This electron detector features a spot-on alignment system which ensures accurate beam placement by monitoring beam positions and current using a wavelength spectrometer to determine the proper beam position. Additionally, HITACHI S-2300 possesses a stage tilt function that allows for navigation through 3-dimensional samples. This helps to reveal fine features which can be difficult to visualize with conventional imaging. It also reduces the need for additional stages or sample rotations which tend to be time-consuming or difficult. Other unique features of S-2300 include its Vacuum Viewing System (VVS), which allows for the observation of samples in real-time within the SEM chamber. This helps to reduce preparation time which is often required with SEM imaging. It also has an ultra-low vibration viewing chamber designed to minimize interference from mechanical and environmental disturbances for accurate imaging and analysis. HITACHI S-2300 scanning electron microscope is an extremely powerful tool for imaging and analyzing a variety of samples. Its combination of high-quality signal, enhanced electron detector, 3-dimensional imaging, and real-time observation capabilities make it an ideal choice for researchers in many fields.