Used HITACHI S-2600 #9384729 for sale

HITACHI S-2600 is an advanced scanning electron microscope (SEM) which can be used for a variety of different samples ranging between 5nm and 50 μm in size. It offers high resolution imaging through the use of an electron beam in order to image the surface of a sample. The microscope is also equipped with two energy-dispersive X-ray detectors for elemental analysis. S-2600 has an energy-filtering equipment that is able to segment the primary beam in order to reduce the intensity of high-energy electrons. The system also has an in-column energy filter for optimal resolution. As a result, the microscope is excellent at crystal structure analysis and detecting small defects in samples. The microscope also features a secondary electron detector which can be used to get images in real-time. This detector can also function as a digital interface, making it easy to connect the microscope with a PC or a CCD camera. HITACHI S-2600 also has an ex-situ mode for analyzing samples without having to remove them from the microscope. This feature is useful for analysis of corrosion, wear, and other surface changes. The unit also offers a multitude of contrast modes including phase contrast, geometry contrast, and topography contrast, increasing the variety of data which can be collected. To ensure accurate results, S-2600 also has a large vacuum chamber with a pressure-regulation machine. The pressure inside the chamber can be adjusted based on the needs of the sample, providing high-resolution imaging as well as reducing thermal-induced noise. Finally, HITACHI S-2600 offers a fully automated sample-stage tool which supports environmental capabilities such as heating and cooling. This asset makes it easier to analyze samples at high temperatures and in extreme environments. Combined with the other features, S-2600 is an excellent choice for detailed surface inspection and elemental analysis.