Used HITACHI S-3000H #293645414 for sale

HITACHI S-3000H Scanning Electron Microscope (SEM) is an optical device used to view small objects by scanning them with a scanned beam of electrons. The microscope is equipped with a high-resolution, wide-field objective lens system, two-dimensional (2D) accelerometers and the latest computer-aided image processing technology to provide the user with precise images of the sample surface. HITACHI S 3000 H uses secondary and backscattered electron detectors to image the sample surface. The scanning electronbeam is deflected across the sample surface by 2D accelerometers, with the secondary and backscattered electrons collected at intervals and recorded onto the imaging media. The sample surface is formed into a 3D surface map by scanning it in an x, y and z-plane pattern, thus allowing the accurate measurement of surface features. S-3000H also features a dual objective lens system with one set of lenses for high-resolution and the other for widefield imaging and scanning. This allows for both high-resolution imaging at high magnifications, as well as widefield images of larger areas. The microscope also has a range of scan patterns and sweep modes and can be customized with more specialized scan patterns as needed. The image processing and analysis capabilities of S 3000 H enables images to be processed with high resolution and contrast, as well as being capable of 3D surface reconstruction after processing. The images produced by the microscope have a good fields of view and large to very small features can be resolved and accurately measured. The system is equipped with an automated stage for sample positioning with a wide range of stage-motion sequences to customize the imaging of the surface. HITACHI S-3000H is a powerful optical instrument that provides customers with detailed images of the sample surface and can be used in a wide variety of research applications in both industrial and academic fields. Its combination of versatile scanning modes and powerful image-processing capabilities enables fast and efficient imaging of the sample surface.