Used HITACHI S-3000H #293645473 for sale

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ID: 293645473
Vintage: 2007
Scanning Electron Microscope (SEM) 2007 vintage.
HITACHI S-3000H is an advanced scanning electron microscope designed to provide high resolution imaging and analysis of a wide range of sample types from biological specimens to fine materials. HITACHI S 3000 H has an integrated field emission gun (FEG) with a maganin lens, allowing for a strong depth of focus and high-resolution imaging. It is equipped with an enclosed high-resolution EDS detector and an optional EBSD detector for the analysis of crystal structure and crystallographic orientation at the atomic level. The microscope is equipped with computer-controlled image stitching and video cycle functions, allowing for up to 600 km of combined magnification and resolution. S-3000H also utilizes a MULTEC detector for imaging and automated particle/crystal analysis, enabling high speed imaging and characterization of small regions of large fields of view. This functionality gives researchers the ability to map subtle surface details with nanometer resolution and produce beautiful three-dimensional images. S 3000 H's electronics components and powerful software provide precision control over imaging parameters such as acceleration voltage, beam geometry, current, and resolution. It also offers additional features, such as a magnification magnifier, calibrations, and specialized imaging modes. HITACHI S-3000H comes with a built-in laser autofocus system that ensures a reliable, automatic focus on each region of the sample. It provides a choice of long working distance objectives, providing more flexibility when working with different sample sizes. In addition, the system is capable of real-time remote imaging and stage drive control, with an estimate of up to 200 nm accuracy over a travel range of up to 4,500 pixels. HITACHI S 3000 H can be configured with an optional XE Crystal­Analysis software package for automated crystal characterization, as well as automated mapping and classifying of particles and crystals. This feature can significantly reduce the time it takes to analyze samples and prepare reports. Overall, S-3000H scanning electron microscope is an ideal choice for researchers who require high-resolution imaging and analysis of multiple samples. Its combination of advanced features and cutting-edge technology provides maximum flexibility and the utmost accuracy when viewing and analyzing a wide range of sample types.
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