Used HITACHI S-3000N #9312349 for sale
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HITACHI S-3000N is a scanning electron microscope (SEM) used to analyze surface and near-surface features of solid samples. It is capable of achieving magnifications up to 300,000x, making it ideal for a wide range of applications such as semiconductor research, materials science, and failure analysis. With a specimen chamber measuring 80mm in diameter, it can accommodate samples up to 70mm in height. HITACHI S-3000 N produces high quality images, thanks to its unique aberration-corrected ultra-high resolution Schottky electron gun. It also features a rotatable and tiltable stage for quickly and easily positioning the sample for optimal imaging. In addition, its aberration-corrected field emission column and high voltage power supply allow for precise beam manipulation, even at high magnifications. This results in images that are highly detailed and extremely precise. S 3000 N is also equipped with a range of advanced image-processing and analysis tools. This includes a range of automated measurements such as line and shape analysis, topographical reconstruction, stereological analysis, and particle sizing. Users can also perform a range of elemental analyses with the sensor-mix process. Additionally, its intelligent imaging algorithm can compensate for slight sample movement, allowing users to achieve accurate, repeatable results. S-3000N also has an impressive suite of operating and safety features. It includes an integrated touchscreen interface and simple fingertip controls, allowing users to efficiently operate and control the microscope. S-3000 N is also operated in a sealed vacuum environment to ensure optimum performance and protection of the sample. It also has a range of safety features, such as a safety door switch and emergency stop switch, to protect users from accidental exposure to the electron beam. Overall, HITACHI S 3000 N is a powerful, highly capable scanning electron microscope. It features the latest in design, engineering and features, and provides users with excellent image quality, precision control and advanced image-processing capabilities. It is an ideal tool for a range of applications, from basic research to failure analysis.
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