Used HITACHI S-3500H #9208243 for sale

HITACHI S-3500H is a scanning electron microscope (SEM) developed by HITACHI High-Technologies Corporation. It offers a high degree of imaging accuracy, providing a resolution of up to 0.5 nanometers and an image size of up to 20mm. The instrument's advanced digital signal processing capabilities contribute to its outstanding image quality. Moreover, its versatile features and advanced technological features facilitate user operation, helping the user obtain more reliable and accurate data. The instrument is equipped with a digital signal processing equipment and a high-sensitivity digital imaging system which allows image capture even at low magnification levels. For sample irradiation, the unit employs a field-emission electron gun (FEG) to provide high-brightness electron beams to enhance resolution and improve contrast. In addition, the machine is designed to be easy to use, featuring a semi-automated tool with an open hardware architecture for rapid and precise alignment of the objectives. This enables the user to quickly obtain sharper images with a greater level of detail. For operation, the asset includes an increased number of parameters to explore the surface topography of an object or material, free of any interference from environmental factors. The model is capable of collecting spectral information from specimens at different magnifications, which provides enhanced imaging capabilities. This also enables the user to identify different elements present in the sample. With its high-magnification capabilities, the instrument is capable of effectively analyze imaging of nanoscale features such as those found on integrated circuits and other fine-scale mechanical components. The instrument's software has both a user-friendly interface and is equipped with a sophisticated control equipment which offers users a wide range of control functions and allows users to customize parameters. Additionally, the system can use quantitative analysis methods to produce higher accuracy images. The advanced subtraction mode enables the user to remove unnecessary artifacts and noise, improving the overall accuracy. The unit also features a wide range of automatic measurement options which include, but are not limited to, area, length, and position measurements. The SEM also benefits from an automated sample handling and navigation machine, which facilitates quick and easy sample switching, greatly minimizing the time needed for setup and operation. Furthermore, the tool is integrated with a 3D display for easy viewing of complicated 3D sample structures, helping the user to acquire precise imaging results. Finally, the instrument is compatible with a variety of accessories such as EDS, EBSD, and CLEM, allowing the user to further optimize the performance of the unit. In conclusion, S-3500H provides a wide range of functions and capabilities to enhance imaging accuracy and improve images. Thanks to its versatility and advanced technology, the instrument is capable of producing high-quality, reliable images which can be used to perform sophisticated analyses.