Used HITACHI S-4160 #293586847 for sale

HITACHI S-4160 is a scanning electron microscope (SEM) used in research and industrial applications. This SEM incorporates a highly sensitive electron detector that affords users with higher resolution images and an improved signal to noise ratio. The instrument is also equipped with an automated image stitching software that enables researchers to compile a homogeneous image from numerous low-magnification images. HITACHI S 4160 is equipped with an analytical SE detector allowing for the capture of secondary electrons in addition to other signals such as backscattered electrons and characteristic X-rays. This detector is sensitive to high-energy electrons allowing for the capture of images having resolutions of better than 3 nm at low accelerating voltages. The EDS systems for S-4160 allows for the detection and quantification of elemental composition in the sample being viewed. It is capable of measuring elements from boron to uranium with a spatial resolution of 1 μm. This electron microscope is capable of achieving resolutions up to 4 nm in backscattered electron (BSE) mode and boasts of a comprehensive range of magnifications of up to x400,000. This enables the instrument to capture images with complete clarity and detail. The microscope is also capable of collecting various signals such as secondary electrons and backscattered electrons which can be used to calculate the topographic and elemental information of the specimen being viewed. S 4160 is also equipped with an energy-dispersive X-ray analysis spectroscopy (EDX) which allows for elemental analysis of the specimen with the added resolution of 1 μm. This EDX system is compatible with a wide array of detectors allowing for an increased detection of elements in the range from boron to uranium. The microscope is also capable of generating images with low-kV operation, which reduces the adverse effect of charging on the specimen being viewed. Specifically, the specimens can be charged at low levels, thus ensuring greater image accuracy. In addition, HITACHI S-4160 is equipped with a high capacity stage that allows for larger sample sizes to be viewed with ease. This is especially useful for large samples, such as those encountered in industrial applications. Furthermore, the stage can be easily adjusted in the horizontal and vertical direction allowing for precise sample placing. HITACHI S 4160 is a powerful scanning electron microscope (SEM) that is suitable for both research and industrial applications. This SEM comes with a highly sensitive electron detector, an automated imaging stitching software, an energy-dispersive X-ray analysis spectroscopy, and a high capacity stage that allows for larger sample sizes to be viewed with ease. The instrument is capable of resolutions up to 4 nm and magnifications of up to x400,000, affording users with high-resolution images with improved signal to noise ratios.