Used HITACHI S-4160 #293609361 for sale

HITACHI S-4160
ID: 293609361
Wafer Size: 6"
Scanning Electron Microscopes (SEM), parts machines, 6".
HITACHI S-4160 Scanning Electron Microscope (SEM) is a high quality imaging equipment that is capable of operating at low to high magnifications. It is equipped with an Automatic Light Exposure Control (ALEC) system for optimum imaging conditions. The unit is composed of an electron column, casing, specimen chamber, stage, and control machine. The electron column contains an electron source, lenses, and detectors. The casing house the chamber and its associated components, including the coils, which create the magnetic field. The specimen stage of HITACHI S 4160 is designed for manual operation with a choice of x-y-z and θ-φ stages. It is capable of handling a range of specimen sizes (including a maximum sample size of 70 mm) and has a range of sample holders for SEM imaging. The x-y-z stage can be manually adjusted to fit specimens up to 70mm in size, while the θ-φ stage provides precise fine movement which allows specimens to be tilted, rotated and moved with precision. The main function of the SEM is to enhance the resolution of images. To achieve this, the microscope creates a tightly focused beam of electrons that can detect the surface and inner structure of a sample at very high magnifications. S-4160 is equipped with an Energy Filter Detector (EFD), which is also commonly known as a Bibliographic Thematic (BTF) detector. This feature allows for maximum resolution and optimum image clarity. The tool also has a multi-angle secondary electron imaging (MASE) detector which gives a an ideal image in multiple observation points. S 4160 is operated with the HiCalc Plus7 software, which simplifies the operation of the microscope and gives the user access to a range of image processing functions. The software is organized into three main sections - Image Analysis, Measurement and Operation. Each of these sections has its own set of commands and functions. The Image Analysis section offers functions like condition analysis, histograms, 3D rendering and scanning in multiple scales for a range of measurements and analyses. The Measurement section assists in drawing and saving detailed line and out of area data, while the Operation section enables the user to calibrate the imaging asset, make adjustments to the stage, vacuum, and electronic settings. It also open other features like photomontage and 3D tomography. HITACHI S-4160 is an imaging model with excellent resolution, accuracy and repeatability and provides a rapid, reliable and cost-effective way to examine specimens at high magnifications. It is a valuable imaging tool in a range of applications including materials science, semiconductor technology and biological research.
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