Used HITACHI S-4160 #293637746 for sale
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ID: 293637746
Scanning Electron Microscope (SEM)
Motorised stage: 150 mm x 150 mm
Max specimen size: ø8".
HITACHI S-4160 is a high-performance scanning electron microscope (SEM) designed for a wide range of microscopy and analysis needs. It has superior imaging and analysis capability that provides unmatched individuality of images, accuracy and high resolution. The SEM is equipped with an advanced crystalline lens system, which enables the user to rapidly capture and magnify high-quality images of samples at high magnification in both the optical and scanning modes. HITACHI S 4160's unique range of features allow the user to quickly switch between optical and scanning modes while maintaining perfect image alignment and accuracy. S-4160 utilizes an electron column, featuring a LaB6 filament, which is capable of producing electrons at an accelerating potential up to 30KV. This powerful electron beam enables greater imaging resolution and magnified analytical capabilities. In addition, the FIGARO-analyzer allows for more precise analysis, with spatial resolution of up to 10 nanometers. The advanced X-ray imaging system allows for simultaneous acquisition and analysis of X-ray emission from samples. The high sensitivity of S 4160 helps to determine the smallest particles with high accuracy. With its most advanced ion-sensitive detector, the SEM is capable of achieving secondary-electron images at unprecedented resolving power beyond 60,000x. The SEM offers a wide dynamic range, from nucleation to crystallization, and can support the understanding of materials behavior across multiple length scales, from nanometers to microns. The user-friendly operating system provides access to a wide range of features to assist user productivity, including on-screen annotation, image processing and correcting, and real-time 3D visualization. HITACHI S-4160 offers a degree of flexibility and control that is unrivaled among SEMs. The powerful combination of features, including superior imaging capability and accuracy, high resolution, wide dynamic range, and versatility make it the ideal choice for materials research.
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