Used HITACHI S-4160 #9048202 for sale
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ID: 9048202
Wafer Size: 8"
Vintage: 1996
Scanning Electron Microscope (SEM), 8"
Metro system
1996 vintage.
HITACHI S-4160 scanning electron microscope (SEM) is a high-tech imaging tool that is used to acquire extremely detailed and precise images of the microscopic structures of samples. It is ideal for industrial, research, and teaching applications. HITACHI S 4160 is equipped with a LaB6 electron gun and uses a digital SDD or SiLi detector for X-ray detection. It has an in-lens objective and a large field of view, with up to 200,000x magnification depending on the lens specified. It also has a fast image capture rate, with image acquisition time of only 40 nanoseconds. S-4160 utilizes a cold-cathode secondary electron (SE2) detector, as well as inelastically scattered and backscattered electrons (BSE1/2) detectors. The SE2 detector enables imaging of the surface topography of the sample with high-resolution, while the BSE detectors allow for observation of the sample's composition. This distinction between topography and composition allows users to gain new insight into the nature of their sample. S 4160 incorporates an automated sample stage which allows for precise motorized positioning, allowing sample movement in the X, Y, and Z axis. This offer unprecedented samples control and enables to quickly and precisely move the sample between different positions. HITACHI S-4160 also has a Universal Coarse Vacuum System (UCVS) which enables enhanced vacuum control, resulting in improved operation. HITACHI S 4160 has a variety of imaging capabilities. It can acquire high-resolution images with an electron beam of as low as 5nm in size, as well as low-vacuum imaging which gives users the ability to image in low-vacuum environments. It also has variable-angle imaging capabilities, which lets users tilt the sample at an angle up to 45° to acquire images from a different point of view. Overall, S-4160 SEM is a powerful and versatile imaging tool that can provide extremely detailed images of microscopic objects. With its advanced features such as automated motorized sample movement, variable-angle imaging, and high-resolution imaging, S 4160 is an essential tool for a variety of industrial, research, and teaching applications.
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