Used HITACHI S-4160 #9200118 for sale

HITACHI S-4160 is a scanning electron microscope (SEM) that operates by raster scanning a focused charged particle beam over a specimen surface and collecting the resulting secondary electrons, backscattered electrons, and X-rays to produce an image. It offers high resolution—down to below 0.2-nanometer level—with optimal and long-lasting images. This SEM is also extremely easy to use; users can operate it with just four knobs and switches, making it suitable for a wide range of scientific and industrial applications. HITACHI S 4160 is equipped with a spherical aberration corrector system and a high resolution objective lens to ensure accurate imaging at very high magnifications up to 1000,000x. It also has a field-emission electron gun (FEG), providing a well-collimated and high-intensity electron beams with low chromatic abberation and high stability. The FEG further contributes to the high image quality by decreasing alignemnt and maintenance time. The Tilt-Align System in S-4160 is designed to facilitate the alignment of the axes of the sample and the objective lens. This enables precise changes in the angle between the specimen and the electron beam for tilting activities. Combined with the dual-axis auto feature, the user can observe microstructures in different orientations without any manual adjustment. As for image analysis, S 4160 is equipped with the unique 3D imaging mode which enables simultaneous measurement and display of three directions in a 3D image. HITACHI S-4160 also has a wide range of image analysis functions, including automated image measurement, PDF output, automated value computation, and image splitting. This allows users to accurately and conveniently analyze the most complex specimens. HITACHI S 4160 comes with a standard auto stage, a digitized specimen stage, and an auto sandblasting function. The auto stage is designed to facilitate the operation and observation of specimens by automatically controlling the position adjustments and sample rotation. The digitized specimen stage allows users to observe six different specimens without any manual adjustment. The auto sandblasting function enables accurate sample preparation without damaging specimens. Overall, S-4160 is a powerful and easy-to-use scanning electron microscope that is suitable for advanced analysis in a wide variety of fields. Its advanced imaging, image analysis, and stage functions make it an ideal choice for many applications.