Used HITACHI S-4160 #9261877 for sale

HITACHI S-4160 is a scanning electron microscope (SEM) with a high resolution imaging capability. It is equipped with an energy-dispersive X-ray microanalysis system (EDX) and an electron backscatter diffraction (EBSD) system for capturing information about minerals, elements, and other materials. HITACHI S 4160 has a microscope column capable of producing high-resolution imaging with a large depth of field and wide scan range. The SEM has a magnification range of 50x-160,000x with a resolution of 15nm and a field of view of up to 3.4mm. It is capable of producing both high-contrast and low-contrast images. S-4160 has an EDS detector with capabilities for element mapping, particle size analysis, composition analysis, and quantitative elemental analysis. The EBSD system is user friendly and provides data for mineral phase determination. S 4160 has a nano-scale specimen surface observation stage, which enables users to observe the surface of extremely small specimens. It also has an automation bench, allowing users to program specimen movement for scanning. The automation bench is programmed to move the stage quickly and precisely, allowing for a high-throughput of sample observations. The microscope also has a built-in shock absorber, for reducing vibration and noise during observations. Overall, HITACHI S-4160 is a powerful, versatile SEM with a low cost of operation. With its unique features, it is ideal for imaging of minerals and other material analysis. It provides high resolution imaging with a range of magnification, and is suitable for a variety of applications including research and industrial settings. With its combination of features, HITACHI S 4160 is an effective tool for surface observation and analysis.