Used HITACHI S-4160 #9277912 for sale

HITACHI S-4160 is a scanning electron microscope (SEM) designed for the analysis of semiconductors and other materials. This state-of-the-art SEM utilizes a principle of secondary electrons to produce highly detailed and accurate images of samples. HITACHI S 4160 offers excellent imaging resolution, as well as a wide range of features to suit a variety of SEM applications. S-4160 features a low-noise, 1,000X magnification, Frutiger-type field emitter, capable of producing crisp, high-resolution images. In addition to its excellent imaging capabilities, S 4160 also provides a range of analytical capabilities for efficient sample analysis. These include energy dispersive X-ray spectroscopy (EDS), electron backscatter diffraction (EBSD), electron energy-loss spectroscopy (EELS), cathodoluminescence (CL), and Auger electron spectroscopy (AES). HITACHI S-4160 is engineered for ease of use and smooth operation. Its automated specimen transfer system allows for efficient specimen exchange and its color digital video/multi-DIC TV/4k HD imaging allows for real-time image viewing. In addition, its sophisticated and versatile control system enables a wide range of settings and parameters to be configured in order to customize the SEM's performance. HITACHI S 4160 is constructed with a solid state detector and a multicoated sample chamber to reduce surface charging and reduce specimen damage. The internal pumping unit operates at very low noise levels and is extremely stable. With a compact design and flexible operation, S-4160 is an ideal SEM for a variety of applications. As an SEM optimized for use in semiconductor analysis and failure diagnosis, S 4160 is an excellent choice for a variety of applications. It offers excellent imaging resolution, analytical capabilities, and advanced control. HITACHI S-4160 is well-suited for applications in materials science, nanotechnology, business, industry, and research.