Used HITACHI S-4300 #9151034 for sale

HITACHI S-4300 is a scanning electron microscope (SEM) used for applications such as materials analysis, semiconductor manufacturing process development and repair, and failure analysis. HITACHI S 4300 features high resolution imaging, excellent depth of field, and a high signal-to-noise ratio. This makes the microscope an ideal choice for applications requiring high-resolution, high-contrast imaging with magnification ranging from 100x to over 500,000x. The SEM uses an electron beam to excite target samples. This generates secondary electrons, electromegatively charged electrons that can be detected and used for imaging. S-4300 has a scanning electron source (SES) that is capable of producing an electron beam with a current of up to 0.2mA at 10kV. It also uses a control system to help minimize the electron beam deviation, ensuring high resolution imaging. The microscope is equipped with a high-resolution current stigmator, which focuses the electron beam onto the specimen. This ensures high-resolution imaging even at high magnifications. The stigmator is adjustable, allowing for fine adjustment of focus along two axes. In addition, S 4300 has a variety of detector options, designed for different types of sample analysis. These include back-scattered electron detectors, secondary electron detectors, and annular dark field detectors. This allows the microscope to be used in a variety of analytical applications. Furthermore, HITACHI S-4300 has an optional in-lens system, which provides high-resolution imaging of the specimen. HITACHI S 4300 is a reliable, high-performance scanning electron microscope. It provides excellent performance, with plenty of user-friendly features, making it suitable for many different types of analytical applications.