Used HITACHI S-4700 Type II #9259272 for sale

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HITACHI S-4700 Type II
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ID: 9259272
Cold Field Emission Gun Scanning Electron Microscope (CFE-SEM) OXFORD EDS included Low kV performance with resolution of 2.1 nm at 1 kV (2) Secondary electron detectors.
HITACHI S-4700 Type II scanning electron microscope (SEM) is a powerful piece of microscopy equipment that uses a scanning electron beam to produce high-resolution images of the surface of a sample. It is a versatile tool that can be used for imaging and analysis of a wide variety of materials, such as solid metals, biological tissues, and minerals. HITACHI S 4700 TYPE II features a unique dual-column design that enables the user to select from a range of accelerating voltages ranging from 1 kV to 30 kV. This provides high spatial resolution and low specimen drift, reducing the need for frequent focusing. The SEM is capable of producing high-resolution images at magnifications of up to 500,000x and can produce color images to better analyze certain features. S-4700 Type II has a range of advanced techniques to increase image accuracy and contrast, such as backscattered electron imaging (BSEI), secondary electron imaging (SEI), and energy-dispersive X-ray spectroscopy (EDS). SEI allows for imaging with ultra-small electrons and produces mainly topographic images, while BSEI uses more massive electrons that are scattered from the sample and produces images with more surface features. The EDS capability allows the user to analyze elemental composition and is used mainly to look at thin film structures. S 4700 TYPE II has many features that make it ideal for a variety of applications, such as the nanoscale analysis of semiconductors and devices. It is also capable of characterizing biological samples as well as materials such as polymers, ceramics, and metals. The user-friendly and easy to use software makes the SEM an invaluable tool for academia, research, and industry. Additionally, HITACHI S-4700 Type II comes with a variety of sophisticated accessories such as a video monitor, a vacuum system, and a camera interface. The integrated vacuum system creates a clean environment for imaging and analysis, while the camera interface allows for real-time data acquisition. The video monitor displays high-resolution images in a variety of viewing formats. Overall, HITACHI S 4700 TYPE II is an sophisticated and powerful imaging tool used for nanoscale analysis of a variety of materials. Its functionality and accessory features allow the user to make the most of the imaging capabilities this SEM has to offer.
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