Used HITACHI S-520 #9080001 for sale

HITACHI S-520 scanning electron microscope (SEM) is a powerful analytic tool used in many scientific fields for imaging and analysis of materials on the nanoscale. With beam energies and resolutions of up to 30 kV and 3 nm, respectively, this microscope is able to achieve highly detailed imaging. S-520 features a standard acceleration voltage of 0 - 30 kV and is able to produce a high-resolution, high-contrast image using an electron beam that is accelerated and focused by a series of lenses. These beams are used to probe the sample at different angles and at different levels of zoom, allowing precise visualization. The microscope can generate two-dimensional images of sample surface epitaxial features in plan view with a lateral resolution of 3 nanometers. In addition to imaging, the microscope can be used to examine semi-conductor samples with an energy dispersive spectroscopy (EDS) system for mapping elemental composition. The microscope frame is composed of high-tensile aluminized iron rigidly mounted on a reinforced frame isolated from vibrations. The entire instrument is enclosed in a stainless steel cabinet for optimal vibration protection, making it ideal for use in busy laboratories. Controlling the electron beam is done from a color computerized touchpad display with a large database of presets that can be easily accessed. HITACHI S-520 includes a number of features to maximize user convenience. A digital camera can be attached to the microscope for real-time viewing, and a USB port allows for easy data transfer to external devices for further analysis on a computer. In addition, the microscope has a programmable joystick for precise beam alignment without having to manually adjust the controls. S-520 scanning electron microscope is a powerful tool for visualization and analysis of materials on the nanoscale. Its advanced features, precision control and high resolution make it well suited for a variety of scientific applications.