Used HITACHI S-520 #9131610 for sale

ID: 9131610
Scanning electron microscope.
HITACHI S-520 scanning electron microscope (SEM) is a high-end imaging instrument which enables the observation of objects at the nanoscale. S-520 delivers clear, detailed images of complex surface structures, offering superior performance and flexibility in the range of samples it can image. It has a large advancement in the field SEM technology due its large depth of field and clarity to enable even the most challenging samples to be accurately imaged and studied. This instrument utilizes the acceleration voltage of the incident electrons to create an image of the surface of the sample. The main components of the equipment includes an electron column to generate and focus the beam, an electron gun to generate the electrons and a detector module to detect the backscattered secondary electrons. The system is equipped with a high-resolution power supply, automatic sample alignment and an adjustable particle optical unit which enables a wide array of samples to be prepared and observed. HITACHI S-520 has an operating range of 0.5 to 30 kV and a high resolution of 1nm at 15kV and 2.2nm at 30kV. The detector has a low noise electronic circuitry and is housed in a sealed module. The view field size can be up to 50 millimeters in diameter and features a dislocation reduction function which prevents the image from becoming distorted when vibration is detected. S-520 can be used to observe a wide variety of samples from non-conductive materials, including biological materials such as cells, tissues, and organisms. Specialized techniques, such as scanning ion microscopy (SIM) and EDS (energy dispersive spectroscopy) analysis, can be used to investigate the composition and chemistry of a sample with a precision of less than one micron. HITACHI S-520 also features an intuitive graphical user interface which can be used to control all functions and monitor the machine. It also includes a programmable stage to enable automatic alignments and automated measurements. The instrument is designed for large batch users and it requires minimal maintenance to keep it in top condition. S-520 is a powerful microscopy instrument that can be used for imaging, analysis, and visualization of samples at the nanoscale. With advanced features and superior performance, it is a reliable and cost-effective tool for those looking to efficiently study objects at the nanoscale.
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