Used HITACHI S-530 #9038452 for sale

HITACHI S-530 is an advanced scanning electron microscope (SEM) developed by HITACHI Ltd. for use in a wide range of scientific and industrial applications. This SEM is equipped with a high-resolution cold field emission tip with a spot size of 5.2 nm and a working distance of 6.5 mm. This enables researchers and industrial engineers to analyze samples with sub-nanometer resolution. HITACHI S 530 can be used for a variety of scanning applications, including surface analysis, 3D imaging, nanostructures, and circuit analysis. S-530 is equipped with spherical aberration correctors (CsCsCs) to reduce spherical aberrations and optimize image quality. This increases the SEM's resolution and image contrast. S 530 uses secondary electron- (SE-) and secondary ion- (SI-) detection to detect secondary electrons, ions, Coincident Imaging® mode to correlate SE- and SI-detected images and Energy-Filtered Imaging™ to detect multiple elements in one analysis. HITACHI S-530 has an high vacuum chamber with a base pressure of 1.3 × 10-4 Torr at a maximum acceleration voltage of 30 kV, a high volt power supply of 12 kV, a gas chromatograph vacuum equipment, an environmental and vacuum controller, and a tilting stage. This SEM also includes a detector system for both SE and SI information, as well as backscattered electron imaging and Auger electron imaging. In terms of operation, HITACHI S 530 has a corrosion-resistant chamber coating, an automated sample changer unit, a low-noise electron beam, a wide range of pre-scan and scan settings, advanced video cropping, and auto brightness/contrast adjustment. It also includes a color display with a 19-inch monitor or an optional Multi-Eye display with split-screen capability. S-530 also has a variety of software functions, such as HITACHI SMART Score software machine for analyzing circuits and assessing device performance. This software is designed to parse and analyze raw SEM data and to compare semiconductor test chips with stored library references. S 530 also is compatible with a variety of analysis software packages, such as SE Analysis EXscan and the Quantum Autotracking Autoscanner. In conclusion, HITACHI S-530 scanning electron microscope is an advanced SEM that provides users with sub-nanometer resolution for sample analysis. The CsCsCs correctors, gas chromatograph vacuum tool, color display, software functions, and other features make HITACHI S 530 an ideal choice for applications ranging from surface analysis to circuit analysis.