Used HITACHI S-5704 #9207190 for sale

HITACHI S-5704 is a scanning electron microscope (SEM) designed for a wide range of research and commercial applications. The equipment offers an advanced level of imaging to allow scientists and engineers to gain insight into their sample's microstructure and morphology. S-5704 utilizes a variable pressure field emission gun (FEG) which allows for a range of optimized analytical conditions ranging from 0.5 to over 100 ultra high vacuum (UHV). A built-in electromagnet allows for electron beam deflection and stability. Scan parameters are adjustable for a large range of operation needs as the microscope is equipped with an advanced control system. HITACHI S-5704 boasts a resolution of under 1nm due to its state-of-the-art single-beam detector, allowing for better imaging than available in other SEMs. Additionally, the microscope offers energy dispersive X-ray (EDX) detection providing qualitative and quantitative elemental analysis of the sample. Moreover, S-5704 uses a computer to control the microscope's motion. This allows for user-friendly operation with a large range of functions that are fitted to the unit. Image analysis is done through a high-performance 3D vector software program making it simple and effective to use. In addition, HITACHI S-5704 includes an in-lens detector which provides for improved topographical observation at higher magnifications. Using a more optimized electron beam, the combination of the detector and the in-lens detector maximize the signal-to-noise ratio, resulting in enhanced surface imaging. Overall, S-5704 is an excellent SEM machine, featuring advanced imaging capabilities and precise analytical features. It allows customers to study surfaces and structures with highly detailed and accurate images to gain a better understanding of the sample's structure and morphology. HITACHI S-5704 provides an excellent platform to a variety of researchers and engineers in many fields.