Used HITACHI S-6000 #293652751 for sale

HITACHI S-6000 Scanning Electron Microscope (SEM) is a high-performance analytical tool designed for a range of applications from routine materials analysis to advanced technology development. The instrument is equipped with high resolution low voltage, state-of-the-art field emission electron sources, advanced imaging systems, and powerful software to provide enhanced resolution and contrast and a variety of analytical options. HITACHI S 6000 SEM offers innovative analytical techniques such as X-ray Energy Dispersive (XEDS) spectrometry, X-ray Fluorescence analysis (XRF) and secondary electron imaging for imaging and analysis of both nonconductive and conductive surfaces and materials. S-6000 offers sophisticated imaging capabilities and a wide range of automated measurement functions. Its high-resolution imaging enables users to detect fine features and measure dimensional information with high accuracy. The instrument can achieve resolutions down to 0.6nm so images can retain a sharp level of resolution with high contrast. Images can also be magnified up to 5,000x, allowing users to view and analyze very small objects. The integrated software suite includes a range of tools for image optimization, visualization and analysis, enabling users to quickly characterize materials, locate and measure features, and create detailed reports. S 6000 is equipped with a variety of detectors, such as a secondary electron, backscatter and X-ray imaging detectors, to provide images with a wide range of magnification, superior contrast and resolution. The instrument can be set up to collect various types of X-ray spectra, including X-ray elemental maps, line scans and X-ray spectra. Combining these imaging and analytical methods, users can measure the composition and properties of materials at the microscopic level. HITACHI S-6000's advanced software and automation enable users to efficiently analyze and report sample data. The software suite includes a range of user-friendly analytical tools, including particle analysis, automated pitch measurements, grain measurement analysis, and film thickness measurement. The instrument is equipped with a mass storage device that allows multiple users to access, store and retrieve data, enabling collaborative research. Overall, HITACHI S 6000 is a high-performance analytical SEM, suitable for a variety of research and industrial applications. Its powerful imaging and analysis capabilities, combined with software tools and automation make it an ideal tool for materials characterization. The instrument offers high resolution, superior contrast, and a range of automated measurement functions that help to accurately analyze samples and generate detailed reports quickly and efficiently.