Used HITACHI S-6000 #9068881 for sale

HITACHI S-6000
ID: 9068881
Wafer Size: 5"
Scanning electron microscope, (SEM), 5".
HITACHI S-6000 is a scanning electron microscope (SEM) that incorporates an electron beam and a high-capacity digital measurement device to analyze the surface of various industrial objects in order to examine minute details. This SEM is widely used in a variety of industries and fields for its excellent precision and clarity, and enables high-magnification and multi-dimensional analyses without magnifying glass. HITACHI S 6000 has two main operating modes: scanning and transmission, which can be switched to suit the purpose of analysis. In scanning mode, the electron beam is scanned over the specimen to obtain detailed observations of surface topography, film thickness, faults, voids, corrosion, contamination and other features. In transmission mode, the sample is kept in a vacuum chamber and transmitted electrons penetrate the specimen to reveal the three-dimensional structure inside. S-6000 is designed to reduce the edge effects associated with the electron beam imaging. It utilizes a monochromator to provide a high-resolution imaging system with a small spot size. The device also employs a dual pole field emission electron source for imaging with short convergence angles. This allows for a high-sensitivity and wide depth of field. The device is equipped with an image-forming detector for capturing images of the specimen. It comes with film detection, image capture and analysis software as well as an intuitive graphical interface. The device can accommodate a variety of sample sizes, from 0.2mm up to 10mm. S 6000 is an advanced imaging tool that enables precise analysis with its superior accuracy. By using an advanced signal processing circuit, it offers a wide dynamic range and enables high-speed operations. This SEM is capable of automatically measuring and tracking various parameters with a resolution of up to 0.3 micron. HITACHI S-6000 is a powerful and reliable imaging tool, which allows for high-accuracy imaging, detailed measurements and analyses. Combining excellent resolution, high throughput operation and an intuitive interface, this SEM is an efficient, cost-effective choice for industrial and scientific applications.
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