Used HITACHI S-6000 #9269110 for sale

HITACHI S-6000 is a scanning electron microscope (SEM) designed for use in a variety of applications, such as in materials science, nanotechnology, and semiconductor fabrication. HITACHI S 6000 is capable of operating and imaging in a variety of mode configurations, including backscattered mode and scanning transmission electron microscopy (STEM). Similarly, the microscope can analyze a wide range of samples and eliminate charging effects, allowing it to faithfully represent sample images in their native state. Included with the equipment is a high-resolution direct detector and beam television (BTV) system, allowing S-6000 to capture images of samples with a particularly large dynamic range. This instrument utilizes a monocular type electron column which includes an FE-gun, lenses and detector, a standard operating voltage of 40 to 250 KV and a flexible dwell time adjustment down to 1 μs. S 6000 includes a unique feature set that helps it stand out from similarly configured SEMs; this includes a double-column monocular structure, a Pico-DSP speed up procedure and new SEMnavis software. The double-column is designed to provide a on-axis viewing angle and magnified images, both of which are more suited for high resolution imaging than equivalent microscope systems using single-column optics. The Pico-DSP feature of HITACHI S-6000 allows the unit to capture images at higher resolutions while maintaining incredibly short measuring times. This is accomplished by splitting large electron images into small subsections, allowing the user to capture small areas of the specimen at a time. Additionally, the SEMnavis software allows the user to have full control access over similar settings on the microscope's computer, as well as functions like adding annotations to electron images and integrating multiple images together for detailed analysis. HITACHI S 6000 contains several automated features for easy use. The machine is capable of rapidly scanning multiple stages with a finely adjustable scan speed and has a built-in stage alignment procedure. Also, the integrated collision avoidance software helps to eliminate any motion errors due to potential collisions with the sample surface. Finally, the tool is outfitted with a laser beam monitor to help users identify areas of contamination on the sample surface, which is useful for applications such as material analysis and maintaining cleanliness in the work environment. Overall, S-6000 is an exceptionally reliable and efficient scanning electron microscope that is suitable for a range of applications. Its versatile feature set and user-friendly design make S 6000 a great choice for research labs, industrial and educational settings alike.