Used HITACHI S-6280 #84156 for sale

HITACHI S-6280 is a high resolution scanning electron microscope (SEM). It has an ultra- high maximum magnification of 12,000x and an ultra-high point resolution of 1.4nm. It also features a large depth of field of 30-130nm. The large depth of field and high resolution performance enables examination of large three-dimensional structural features at high magnifications. HITACHI S 6280 features a large 6" x 6" capacity wafer stage and a 4" x 4" goniometer sample holder, allowing it to accommodate large substrates and samples. It also includes an eucentric tilt to analyze the sample at oblique angles. With its limited 3 degree total tilt range, it can produce 2 and 3--dimensional images. S-6280 includes a LaB6 field emission gun and a Landskron cold cathode gun, allowing it to operate at high acceleration voltages. The LaB6 gun provides high resolution imaging, while the Landskron gun enables high-contrast imaging. Both guns operate at five different accelerating voltages and can be used for different applications such as imaging and elemental analysis. The SEM also features a wide variety of controls, detectors and imaging modes, including backscattered electron image (BSE), secondary electron image (SEI), backscattered and secondary electron-induced X-ray spectroscopy (EDX/SX), electron energy loss spectroscopy (EELS), and wavelength dispersive X-ray spectroscopy (WDS). All of these imaging modes and detectors provide high quality images and data for more accurate analysis of samples. Additionally, the SEM offers a number of integrated features such as motorised specimen transfer system, auto-focussing, and scanning area calibration. It also supports an automation option which automates routine activities of the user, such as repetitive scanning and stitching images. S 6280 is a highly versatile scanning electron microscope ideal for nanoscale imaging and analysis of a wide range of samples. It is a valuable tool for research, analytical, and industrial applications.