Used HITACHI S-6280 #9265299 for sale

HITACHI S-6280 scanning electron microscope is an advanced microscope equipment that utilizes digital imaging and energy-dispersive X-ray spectrometry, as well as advanced spectroscopy capabilities. It is an ideal instrument for characterizing samples in a variety of applications, such as chemical and physical analysis of crystals or metals, or for observing the microstructures of materials at the nanoscale. HITACHI S 6280 utilizes secondary and backscattered electron imaging, as well as low voltage windowless spectroscopy, to probe samples. The electron beam optically converges on the sample, resulting in high resolution imaging and spectroscopy measurements. The system is capable of accurate imaging of inorganic, organic, and polymeric materials in a wide range of sizes, from micrometers to nanometers. Additionally, the microscope is capable of quantitative analysis of an SEM image. The microscope operates at high vacuum and is equipped with a cooling stage, enabling observation and analysis at low temperature. The low temperature is essential for insulating materials, such as polymers, and for observing the surface structure and thermal properties of metals. S-6280 also features a field emission gun for beam voltage control, and a user-friendly graphical interface. The user can adjust the electron beam energy, spot size, dwell time, and other parameters with the help of this user interface. In addition, S 6280 is capable of automatic sample manipulation with a two-axis, electronically driven X-Y motorized stage. The unit's large stage has a maximum weight capacity of 10kg, making it suitable for larger samples that require scanning. HITACHI S-6280 employs three types of detectors: two secondary electron detectors, an EDS detector for X-ray analysis, and a backscattered electron detector. The integrated EDS detector combines with the X-ray detector for non-destructive elemental analysis, allowing for a unique analysis and characterization of the sample. HITACHI S 6280 is also equipped with optional accessories such as an in situ heating stage for studying thermal properties, a collection of lenses, a vacuum transfer arm, and an exposure chamber. The transfer arm and exposure chamber allow the user to move samples to and from the microscope without contamination. S-6280 is a powerful and versatile scanning electron microscope machine, with advanced imaging and spectroscopic capabilities. From inorganic and organic materials to metals, this tool provides versatile capabilities for scanning and characterizing samples at the micro and nanoscale. Additionally, the instrument incorporates a range of detectors, as well as optional accessories, making it ideal for research applications in a wide range of fields.