Used HITACHI S-6280 #9359437 for sale
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HITACHI S-6280 High Energy Field Emission Scanning Electron Microscope (FESE-SEM) is a precision instrument used for industrial application, research, and educational purposes. It utilizes small amounts of electrons for magnification and observation. HITACHI S 6280 boasts impressive characteristics such as high electron energy, high resolution images, and a simple user interface. S-6280 is an ultra-high-resolution SEM, capable of magnifying up to 5nm with a high-energy field emission gun to ensure high-resolution imaging over a wide field of view. It has a special stage capable of taking images in the X-Y-Z direction. This enables S 6280 to capture high-quality and detailed images of even the smallest of specimens. It is also equipped with a dynamic secondary electron detector for tracking the topography and distribution of features on a specimen. The FESE-SEM also incorporates a surface analysis system for measuring the composition and thickness of specimens. It has a vacuum chamber and numerous contact probes to efficiently measure the electrical properties of specimens. It is also possible to scan the specimen with e-beam gun to analyze the composition of surface areas. The latest version of HITACHI S-6280 has an in-lens Schottky field emission electron source. This ensures sharp and clear images even at higher magnifications. It also has an environmental control system that maintains the optimal temperature and humidity levels for reliable results. Furthermore, HITACHI S 6280 is a powerful tool that offers numerous features for advanced users. It is equipped with an HV-cue image mode that allows users to select up to five lines to compare their images. Additionally, users can customize the image quality with the advanced image control system. S-6280 High Energy Field Emission Scanning Electron Microscope is an impressive instrument designed for superior imaging, surface evaluation, and analysis of specimens. Its features make it a great choice for industrial applications, educational purposes, and research studies.
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