Used HITACHI S-650 #9080003 for sale

HITACHI S-650 is a scanning electron microscope (SEM) suitable for high-precision analysis and observation of the microstructures or surface topography of materials and micron-scale components. This SEM features a large chamber, allowing for the examination of samples up to 7 cm in width and up to 5.5 cm in height. It also comes equipped with large-sized specimens stages, enabling the insertion of samples which are greater in size than those possible with other conventional SEMs. S-650 features a high-resolution TSE detector, which has high sensitivity and a wide dynamic range for capturing the high-sensitivity low-voltage images which are becoming increasingly essential in today's nanotechnological studies. This detector has an electron beam current of 200mA and a magnification in the range of 5~500k. It is estimated to have a resolving power of about 0.7 nm with an acceleration voltage of 0.2 to 15 kV, and can be used for both high-speed and high-precision scans. The primary scanning modes on this SEM are secondary electrons and back-scatter electrons. With secondary scans for flat, non-conductive samples, high-resolution SEM images and depth profiles can be produced. Aside from this, HITACHI S-650 is also equipped with two different back-scatter detectors, giving you a controlling and focusing beam current in addition to automatic focusing and stigmation. S-650 comes equipped with a large Operation Unit, enabling the capture of two dimensional information all at once. With this feature, the user can observe how the sample is reacting to the electron beam, allowing for control and manipulation of electron beam shape, current, position and scan range. In addition to its high performance scanning electron microscope (SEM) capabilities, HITACHI S-650 also comes with an integrated Energy Dispersive Spectroscopy (EDS) system for chemical composition analysis. This feature is capable of detecting different elements and measuring their relative concentrations in a given sample up to a few percentage points. In conclusion, S-650 provides a wide array of features and functions geared towards achieving high-precision SEM imaging. Its large chamber, high-resolution TSE detector, integrated EDS system, and user-friendly operation unit, allow for precise imaging, chemical composition analysis and manipulation of the electron beam shape and current.