Used HITACHI S-7000 #76295 for sale
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ID: 76295
Wafer Size: 4"-6"
Vintage: 1991
Critical Dimension Scanning Electron Microscope (CD-SEM), 4"-6"
Secondary electron image resolution: 15 nm, 1 kV (150 angstroms)
Magnification: 100x to 100,000x
CD Measurement range: 0.05-100 microns
Electron beam source: Field emission electron gun
Lens system: 2-Stage electromagnetic lens reduction
Auto loader: Single cassette, random accessing
Objective lens aperture: Movable aperture (4 openings selectable / Alignable outside column)
Stigmator: 8 pole electromagnetic type (X,Y)
Scanning coil: 2-Stage electromagnetic type
Specimen stage movement:
X-direction: 150 nm
Y-direction: 150 nm
Z-direction working distance: 5-15 mm
T-tilt angle: 0° to 60°
R-rotation angle: 360°
Accelerating voltage: 0.7~3 kV
Emission extracting voltage V1: 0~6.3 kV
1991 vintage.
HITACHI S-7000 Scanning Electron Microscope (SEM) is one of the most advanced scientific instruments available. S-7000 is a highly precise tool used to study samples in a variety of environments and provide detailed images at the nanoscale level (less than 1 micrometer in resolution). In order to produce reliable images, the SEM uses an electron beam and several components for detection, focusing and imaging. A high voltage power supply can accelerate the electron beam up to 30 KV, allowing for analyses at low- to high-magnification ranges. A condenser lens then focuses the electron beam onto the sample, and a detector can be used to detect backscattered electrons for topographical imaging. The detector also allows for elemental mapping by detecting signals from x-ray spectrometers. For maximum precision and accuracy, HITACHI S-7000 utilizes a fully computerized equipment with both software and hardware controls. It is designed to produce accurate images within a wide range of operating conditions and maintain the highest level of image clarity. Also, because of S-7000's advanced motorized control systems, the SEM is able to operate consistently with no manual adjustment needed. HITACHI S-7000 also features an integrated "sample handling" system that allows specimens to be safely and easily translated, rotated, or manipulated through an automated unit. In other words, S-7000 eliminates the need for manual specimen handling, which greatly reduces the risk of contamination or specimens becoming damaged during the imaging process. In addition, HITACHI S-7000 is capable of producing a wide range of variables dependent on the sample type and operational parameters. This means the capabilities of this SEM are highly adaptable and dependable under different conditions. Overall, S-7000 is an invaluable tool for microstructural and nanoscopic sample analyses. With its wide range of operational flexibility, exact imaging capabilities, and automated sample handling machine, HITACHI S-7000 is an exceptional specimen imaging tool.
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