Used HITACHI S-7000 #9269129 for sale

HITACHI S-7000 is a scanning electron microscope (SEM) designed for analytical and research applications. It is an advanced instrument providing an excellent combination of superior resolution, contrast and throughput. In addition, S-7000 is equipped with a motorized sample stage, providing significant improvements in accuracy and repeatability of measurements. HITACHI S-7000 has a variable-gun chamber designed to be used with up to two different styles of guns. This enables the user to switch between different types of analysis and imaging quickly and easily. The first gun is an acceleration voltage of 20 kV and a high-resolution scanning fitted with a cold field emission (CFE) electron source, allowing 0.2 nanometer resolution. The second gun is designed for low-voltage imaging and is fitted with a LaB6 electron source, providing higher current density for images with greater contrast. S-7000 also features a patented scanning micro-tome system (SMTS). This system enables accurate sectioning and imaging in three-dimensional samples, allowing the user to take detailed measurements of features of interest. The sample stage is motorized, providing the user with the ability to accurately perform repeatable measurements and imaging. HITACHI S-7000 is a versatile instrument that enables a wide variety of applications. It is equipped with a versatile detector system, designed to accommodate various types of detectors, including a secondary electron detector, backscatter electron detector, and low-angle backscatter detector. S-7000 also supports a wide range of software applications, including mapping, overlay, and tomography. HITACHI S-7000 is equipped with a range of image manipulation tools. These tools provide users with options for images such as contrast enhancements, false color, and resolution manipulation. In addition, S-7000 supports automated features for sample alignment and automated measurements. Overall, HITACHI S-7000 is an advanced SEM, designed to handle extensive research applications. It provides a superior resolution, contrast and throughput, as well as a wide range of software applications, image manipulation tools and automated features. This instrument allows for detailed imaging and measurements in samples, enabling high-level research into material structures and properties.