Used HITACHI S-806-C #85052 for sale

HITACHI S-806-C is a scanning electron microscope (SEM) that can be used to capture images of microscopic objects. It uses a scanning electron beam to collect and analyze information related to the microscopic features of a sample. The equipment features a digital camera capable of recording in high resolutions up to 1.2 megapixels, while the microscope itself can magnify objects up to 400,000 times their size. Additionally, the system features a comprehensive control panel that allows users to accurately adjust the microscope's x, y and z stages, so that the exact image of interest can be captured. The vacuum chamber of the microscope includes an array of electron optics to control the electron beam's position and direction. Inside the vacuum chamber is an ion gun for the production of higher kinetic energy electrons, allowing for high-resolution imaging at large magnifications. Additionally, the microscope is designed to minimize both the charging and the artifacts from its electron beam, enabling higher quality images to be obtained. The unit's navigation and imaging tools are both extremely user-friendly and efficient, making it ideal for use in many industrial and scientific applications. The navigation tools allow for the easy and accurate control of the rate at which the electron beam moves on the sample surface, along with a wide range of image capture parameters including brightness and contrast. Furthermore, the imaging tools allow for the capture of analytical images such as energy dispersive spectroscopy (EDS) and electron energy loss spectroscopy (EELS). Furthermore, the machine is equipped with various features that enable it to conduct a range of analysis techniques. This includes the ability to locate elemental distributions and mechanical characteristics of a sample at the atomic scale. In addition, the tool includes a range of software packages to help visualize the collected data and create accurate and highly detailed 3D models. This makes it ideal for various imaging techniques and analysis applications. Overall, S-806-C scanning electron microscope provides a high-quality solution for capturing images from microscopic objects. It features powerful imaging tools, a comprehensive control asset and a range of analysis capabilities, making it the ideal instrument for a variety of applications.