Used HITACHI S-806 #9281005 for sale

Name: HITACHI S-806
Brand: HITACHI
SKU: 9281005
Availability: InStock

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Scanning Electron Microscopes

Manufacturer

HITACHI

Model

S-806

ID: 9281005

Field Emission Scanning Electron Microscope (FE-SEM) Resolution: 6 mm (60Å) - 25KV 20 nm(200Å) - 1KV Mag: 50x ~ 100,000x Specimen stage: Movement range: X and Y O to150 mm Stage drive: Pulse motor Control: Joystick control (Auto eucentric) Z (WD): 5 ~ 35 mm Rotation: 360° Tilt: 0 ~ 60 Wafer loader: Manual loading (Holder, 6") Electron optics Electron gun: Cold field emission type Accelerating voltage: 0.5 ~ 5 kV (0.1kV step) 5 ~ 25 kV (kV step) Extract voltage: 0 ~ 6.3 kV Lens system: Electromagnetic condenser lens systems FCM Objective Secondary electron detection: 2-Stages detection system Objective lens aperture: Heating type movable aperture 4 Openings selectable Outside column (Fine adjustment) Scanning coll: 2-Stages deflection Stigmator coil: (8) Poles electromagnetic type (X,Y) Control and display system: Scanning modes Safety Device CRT Ion coater and pumps Damaged parts: Broken sample secondary electron image, 6" Broken sample-holder.

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HITACHI S-806 is a high performance scanning electron microscope (SEM) designed to achieve superior imaging performance and precision measurements. It features a field emission gun (FEG) electron source, providing high brightness single-beam illumination with ultra-low beam current and dose rates for superior imaging and low noise performance. In addition, HITACHI S806 enables precise measurements and operation through the use of electronic digital imaging, a liquid nitrogen-cooled Scanning Image Processor (SIP) and HITACHI proprietary Device Temperature Control (DTC) system, which provides a consistent performance regardless of ambient temperature. The FEG electron source of S 806 incorporates a newly developed electron column, engineered to offer great stability and control over beam alignment and spot sizes. It can produces a range of electron accelerating voltages, ranging from 3-100kV for wide-ranging applications. S806 delivers superior low-noise images through the use of minimal beam current and both high resolution ADCs and a low-noise preamplifier. S-806 also offers high precision and resolution through its large working distance objective lens, which can be controlled with remote drive stages. Its X-Y stage is capable of high speed serial scanning and is equipped with dual stage drive systems for tip and tilt adjustment. The advanced SIP produces digitized images with excellent resolution and contrast-to-noise ratios, and the DTC ensures fast image input with improved image quality. HITACHI S 806 also features a variety of other user-friendly functions such as computer controlled operation, real-time image analysis capabilities, and X-Y area image display functions. In addition, HITACHI S-806 includes an ergonomic design, with the operation panel and image processing sections being placed further apart for improved operator comfort. Finally, its enhanced software allows for multi-user operation and a selection of measurement and analysis tools, making HITACHI S806 an excellent choice for scientific laboratories.