Used HITACHI S-8620 #9148294 for sale

HITACHI S-8620 is a scanning electron microscope (SEM) that can be used for imaging and analytical studies. This electron microscope uses a focused beam of electrons to generate high resolution, microscopic images of a specimen across a wide range of magnifications. It is capable of high-resolution images up to a resolution of 3 nm. HITACHI S 8620 can operate with a wide range of operating voltages, from 0.1-30 kV, enabling it to take images of various materials. The equipment is also equipped with a fully automated auto-alignment and focus system, which increases the accuracy and convenience of operation. S-8620 has an automated stigmation and focus feature which provides the user with an optimized beam size and shape for maximum resolution and image quality. It also has a field emission scanning electron source which enables the use of very high-energy electrons while maintaining an almost noise-free image. The unit can be used for both imaging and analysis applications, such as elemental mapping, phase contrast imaging, and secondary electron imaging. S 8620 also has a secondary electron detector with a wide dynamic range which enables the capture of both high and low intensity signals. The detector is also equipped with an automated gain adjustment feature which can be used to optimize the image for different specimen types. Additionally, the microscope has a high-resolution digital x-y stage which provides accurate specimen positioning. This stage also has a built-in video display which can be used to help with alignment. HITACHI S-8620 has a range of other features which improve the user experience. These include automatic alignment and calibration of the specimen, automated measurement of characteristics such as thickness, edge position, and profile. It also has a feature-rich data management machine which allows the user to store and process data quickly and efficiently. In conclusion, HITACHI S 8620 is an advanced scanning electron microscope which provides the user with an excellent imaging and analytical tool. It has a range of features which enable the capture of high-resolution images across a wide range of magnifications and analysis applications. The inclusion of an automated stigmation and focus feature, secondary electron detector, and digital x-y stage make S-8620 an ideal choice for imaging and analysis applications in both research and industrial settings.