Used HITACHI S-8640 #9093024 for sale
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ID: 9093024
Wafer Size: 6"
Vintage: 1997
Scanning Electron Microscopes (SEM), 6"
1997 vintage.
HITACHI S-8640 is a Scanning Electron Microscope (SEM) utilized for a large variety of scientific and engineering applications. It has been designed to generate images of up to 3,500x magnification, making it ideal for imaging nanoscale objects and features. S-8640 is able to capture three-dimensional images of sample surfaces and sub-surface features despite rough or uneven surfaces. This is accomplished through its electron beam scanning equipment, which records a very detailed picture of the sample. The scanning electron beam is accelerated to high energy levels, allowing for enhanced resolution measurements down to 1 nm. The beam is able to detect small differences in the surface or sub-surface material, permitting a clear picture of the morphology of the sample. HITACHI S-8640 can operate under a range of operating conditions including low-vacuum and high-vacuum modes, allowing it to operate in a variety of environments. Additionally, the SEM can be used in inorganic or organic material research, with a low dose option that minimizes damage to delicate samples. The SEM is equipped with both in-lens and side-view detectors to provide high quality, three-dimensional images of the sample surface and structure. The secondary electron detector is used to create high contrast images of the sample surface and can identify low atomic number elements such as carbon. Back scattered electrons can be used to detect heavier elements in samples, image crystallographic orientation or to generate topographical information. Additionally, S-8640 is also equipped with an EDS system to differentiate the elemental composition of the sample. The energy dispersive X-ray unit (EDS) uses the X-ray emission from the sample to create a map of the samples elemental composition. The machine utilizes an energy filtering function, allowing for improved detection limits. In summary, HITACHI S-8640 Scanning Electron Microscope is an essential tool for the study and analysis of nano-scale materials and features. It is an effective aid for the study of both inorganic and organic materials, allowing for the generation of detailed three-dimensional images and elemental maps. The microscope is applicable to a wide range of research fields, making it an ideal tool for a variety of scientific and engineering applications.
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