Used HITACHI S-8800 #293645811 for sale

HITACHI S-8800 is a scanning electron microscope (SEM) designed for the highest-level imaging and analysis requirements. This microscope offers superior performance for a wide range of applications, reaping the benefits of the latest technologies. Its optical system features a cold field emission source (FES) with high brightness, astigmatism correction and aberration correction lenses to improve imaging quality while enhancing user convenience. S-8800 can be used in both high-end surface analysis and a range of imaging techniques including scanning transmission electron microscopy (STEM) and energy spectroscopy. With a wide range of automated sample positioning systems coupled with its high resolution and large field of view, HITACHI S-8800 is ideal for inspecting the morphology of a large range of sample types. The image post-processing features include intelligent background removal, automated particle detection and image analysis algorithm to enhance image data. Together with the automated data acquisition functions, S-8800 is capable of delivering high-quality results with minimal operator intervention. HITACHI S-8800 offers even greater flexibility from its advanced stage teaching system and intuitive user interfaces featuring an easy-to-use touch-screen with a graphical user interface. The system's automated stage control, with its stage movement resolution of 50nm, makes sample scanning very precise and robust. By combining high-precision imaging with detailed analysis capabilities, S-8800 is a powerful tool for a wide range of applications. Its advanced features boast tremendous performance and have set the standard for performance and reliability in the high end scanning electron microscope market. Its advanced sample inspection, auto stage and data acquisition capabilities provide users with a highly efficient imaging and analysis solution. The high-performance, analytical capability and versatility of HITACHI S-8800 ensure maximum productivity and allow users to explore their research results with greater confidence.