Used HITACHI S-9160 #9046466 for sale

HITACHI S-9160
ID: 9046466
CD SEM.
HITACHI S-9160 is a scanning electron microscope (SEM) developed by HITACHI High-Technologies. This type of SEM is capable of providing high-resolution imaging and analysis of samples on the micrometer and nanometer scales. S-9160 features adjustable acceleration voltages from 1 kV to 30 kV and stable primary and secondary electron signals, making it suitable for imaging a wide range of materials. HITACHI S-9160 is an analytical SEM that can be used to perform a variety of experiments ranging from basic SEM imaging to energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD) stem imaging. The microscope can be used to image and analyze the surface of a sample in order to identify its structure, elemental composition, and topography. The microscope also offers an array of analytical capabilities such as secondary electron imaging, dynamic secondary electron imaging, and Z-contrast imaging. These capabilities are ideal for examining fine structures, as well as thin-coatings and insulating films. Additionally, S-9160 is equipped with a thermal field emission gun (TFE) that offers excellent resolution and contrast with low noise levels. HITACHI S-9160's EDS system is driven by a computer system and offers energy automatic selection, quantitative analysis, and real-time element mapping. The EBSD system is used to analyze the crystallographic texture of a sample, and it can be used to identify phases, as well as measure lattice parameters. S-9160 is capable of operation at temperatures as low as -200°C and as high as 1000°C. The microscope includes a temperature-controlled stage, which allows for in-situ imaging and analysis of samples. This allows users to study the effects of temperature changes on their samples. HITACHI S-9160 is a powerful SEM well suited for a variety of applications. It offers high-resolution imaging, robust image contrast and many analytical capabilities. Additionally, its temperature-regulated stage and array of imaging options make it an excellent choice for studying the structure, composition, and behavior of many different types of materials.
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