Used HITACHI S-9220 #9239080 for sale

HITACHI S-9220 is a scanning electron microscope (SEM) designed to give high quality, high resolution imaging and analysis of samples down to the nanometer level. It utilizes a two-stage Schottky field emission electron gun and is equipped with modern PC-based control and data acquisition electronics. This equipment features a wide range of high-resolution imaging capabilities including backscattered electron imaging, secondary electron imaging and true color imaging from multiple detectors allowing analysis of both organic and inorganic samples. HITACHI S9220 also provides microanalysis capabilities such as in-lens and accelrated voltage energy dispersive x-ray spectroscopy, electron energy loss spectoscopy, and Auger electron spectroscopy. This system also offers advanced features for electron beam testing such as high-resolution SEM STEM imaging, lamellae analysis, compositional analysis and metal thickness analysis. Using the advanced imaging technology of S 9220, users are able to acquire high-resolution electron images of samples down to the nanometer level. The instrument has been optimized for use with a wide range of irradiation modes, including secondary electrons, back scattered electrons, X-ray microanalysis, electron channelling and transmission electron conditions. A high-performance field emissions electron source allows for high-resolution imaging at low beam current. High vacuum conditions reduce specimen exposure to the electron beam to ensure high-resolution imaging while providing superior analytical performance. S-9220 includes specialized software to capture, analyse and display data. It comes with the SIONVTE operating unit, which offers advanced features such as a detailed analysis database, a high resolution automated stage drive and a zero-bias auto-focus machine. With these tools, it's easier to monitor, control and analyse the samples. This tool also offers an in-lens detector for SE imaging combined with on-the-fly digital image processing for faster and more accurate imaging. A digital specimen stage allows for automated region of interest imaging and more accurate specimen positioning and guidance. The digital imaging asset consists of a 16-bit charge-coupled device camera and a high performance image processing card, which provide an image frame rate of up to 200 frames per second. The one-minute auto focus feature enables users to get high resolution images in less time. HITACHI S 9220 model is a powerful tool for many applications, offering an array of high-resolution imaging, microanalysis and material testing capabilities. Its modern PC-based control equipment and intuitive workflow allows users to perform advanced SEM imaging and analytical tasks quickly and easily. The system offers great versatility and is an ideal choice for any laboratory seeking high-resolution imaging and analysis of nanometer level samples.