Used HITACHI S-9220 #9250171 for sale

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HITACHI S-9220
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ID: 9250171
Wafer Size: 8"
Scanning Electron Microscope (SEM), 8".
HITACHI S-9220 Scanning Electron Microscope (SEM) is a highly advanced imaging equipment designed for the visualization and analysis of a wide range of materials. This system produces high resolution images and is capable of measuring the surface of a sample with nanometer (nm) accuracy. The advanced SEM design features a unique vacuum unit that eliminates contamination and allows for precise and stable sample input and specimen examination. HITACHI S9220 utilizes a bottom-mounted electron gun to generate a focused electron beam that is projected onto the sample surface. The electron beam produces a clear image that is displayed on the monitor. The samples can then be manipulated and examined in three-dimensional (3D) images or tilt series. Additionally, S 9220 has the capability to measure the sample's surface area using secondary electron imaging (SEI) and X-ray mapping (XRM). S-9220 features automated sample stage control which allows for sample manipulation and alignment, making it easy to position the sample for optimal imaging. The high-throughput, computer-controlled stage enables efficient and accurate auto-alignment along with the ability to index the sample to the stage. Due to its advanced design, HITACHI S 9220 has a very adjustable analysis machine. This allows users to modify the analysis parameters and ranges to fit the specific needs of the specimen. Additionally, the SEM has a wide selection of accessories including a variety of analytical detectors, sample O-rings, sample chambers, and vacuum pumps. S9220 also includes an advanced software package, which includes a graphical user interface (GUI), graphical objective generator (GOG), and software-based data acquisition tool. This intuitive software allows users to easily adjust the scientific parameters and generate 3D images of the sample and analyze the data. Furthermore, users can utilize the software to produce accurate 2D images and 3D models of the sample surface. HITACHI S-9220 provides advanced imaging using a powerful combination of scanning electron microscopy and imaging software. This combination allows users to accurately analyze and observe specimens that are too small for traditional microscopy techniques. This high resolution microscope asset is ideal for materials science research and for producing detailed images of various materials.
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