Used HITACHI S-9220 #9309511 for sale
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ID: 9309511
Scanning Electron Microscope (SEM)
(3) IP Magnets
battery
AV operation pane!
MHV beard
(2) Turbo controllers
IP backup unit
(2) Transformers
(2) Stage drivers
Heater assembly
Solenoid valve unit
HV Controller
EVAC Controller
Capacitor power supply
Valve assembly
Camera detector
Camera assembly
Lamp unit
Linear scale preamplifier X. Y
OM Driver
Flowmeter
POST
CNCOR D1 Beard
Axis Driver Motor: X, Y
Linear scale head
Stage O-ring
Alignment unit (Arm)
Sample stage
AV 5.6.7 Valve
Pirani gauge
(2) Penning gauges
SE headlamp
POST HV
Butterfly valve
Booster power supply
Leak valve
pressure sensor
Lamp CN board
VACS Board
L-axis motor
Standby robot controller
Stage HP sensor
Rotating robot
AY3
AV2
Standby robot
Power supply unit
XP5D AMP Board
IMP Damper
Diagonal sensor
AV3 O-ring group
IP Vacuum piping
LC lid
L-Axis ball screw
EMO SW
LC Part sensor
LC Hermetic Seal
ST holder
Roller holder
Chuck Unchuck
Wafer holder
Hotmaru (Fragment)
SUS arm
(2) Turbo pumps
AV2 roller
Movable pin guide
Trap board
Objective lens
Electron gun
Change coil
Movable aperture unit
Cam floor
Scale (Fragment)
Cylinder
Operation unit foot image system board set
Stage controller
Boards:
Lens PS
XDEF PS
KSENS-CN
BEAM-CN
COL-CN
Alarm IF2
EV CX.
HITACHI S-9220 scanning electron microscope is an advanced scanning electron microscope (SEM) equipment, that can be used to observe and analyse samples on a nanoscale level. HITACHI S9220 is one of the most versatile SEMs available on the market, thanks to its multiple detectors, including an ultra-high resolution SE (secondary electron) detector, a large area BSE (backscattered electron) detector, an EBSD (electron backscatter diffraction) detector, and a CL (cathodoluminescence) detector. This makes it ideal for a wide range of materials, including metals, semiconductors, ceramics, composite materials, and polymers. The system has a large cylindrical chamber, known as a column, containing an electron gun and various electron detectors. When the sample is placed within the chamber and the unit is turned on, a stream of electrons is emitted from the electron gun. These electrons then interact with the sample, creating secondary electrons, backscattered electrons, and X-rays. The electrons then collide with the detectors, creating signals which are analysed by a computer and interpreted into a 2D or 3D image of the sample. S 9220 also has low-vacuum scanning capability, which allows for imaging faster than high-vacuum scanning and reduced risk of charging effects on insulating materials. The microscope also features variable pressure operation, allowing for variable observing pressure up to 5 Torr. This is important when observing samples that would otherwise be damaged by a vacuum environment. S9220 also has a number of additional features, such as enhanced image resolution, improved specimen stage movement and X/Y nanometer accuracy. The machine also has an automated alignment function, allowing for fast and easy sample placement without the need for manual adjustment. All of the features of S-9220 make it a highly capable, efficient scanning electron microscope, suitable for use in a wide variety of scientific research and industrial applications. It's ideal for observing and analysing samples at the nanoscale, and provides high resolution images, with minimal sample preparation. HITACHI S 9220 is a powerful tool, and can help researchers and engineers gain an invaluable insight into their materials.
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