Used HITACHI S-9220 #9309511 for sale

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ID: 9309511
Scanning Electron Microscope (SEM) (3) IP Magnets battery AV operation pane! MHV beard (2) Turbo controllers IP backup unit (2) Transformers (2) Stage drivers Heater assembly Solenoid valve unit HV Controller EVAC Controller Capacitor power supply Valve assembly Camera detector Camera assembly Lamp unit Linear scale preamplifier X. Y OM Driver Flowmeter POST CNCOR D1 Beard Axis Driver Motor: X, Y Linear scale head Stage O-ring Alignment unit (Arm) Sample stage AV 5.6.7 Valve Pirani gauge (2) Penning gauges SE headlamp POST HV Butterfly valve Booster power supply Leak valve pressure sensor Lamp CN board VACS Board L-axis motor Standby robot controller Stage HP sensor Rotating robot AY3 AV2 Standby robot Power supply unit XP5D AMP Board IMP Damper Diagonal sensor AV3 O-ring group IP Vacuum piping LC lid L-Axis ball screw EMO SW LC Part sensor LC Hermetic Seal ST holder Roller holder Chuck Unchuck Wafer holder Hotmaru (Fragment) SUS arm (2) Turbo pumps AV2 roller Movable pin guide Trap board Objective lens Electron gun Change coil Movable aperture unit Cam floor Scale (Fragment) Cylinder Operation unit foot image system board set Stage controller Boards: Lens PS XDEF PS KSENS-CN BEAM-CN COL-CN Alarm IF2 EV CX.
HITACHI S-9220 scanning electron microscope is an advanced scanning electron microscope (SEM) equipment, that can be used to observe and analyse samples on a nanoscale level. HITACHI S9220 is one of the most versatile SEMs available on the market, thanks to its multiple detectors, including an ultra-high resolution SE (secondary electron) detector, a large area BSE (backscattered electron) detector, an EBSD (electron backscatter diffraction) detector, and a CL (cathodoluminescence) detector. This makes it ideal for a wide range of materials, including metals, semiconductors, ceramics, composite materials, and polymers. The system has a large cylindrical chamber, known as a column, containing an electron gun and various electron detectors. When the sample is placed within the chamber and the unit is turned on, a stream of electrons is emitted from the electron gun. These electrons then interact with the sample, creating secondary electrons, backscattered electrons, and X-rays. The electrons then collide with the detectors, creating signals which are analysed by a computer and interpreted into a 2D or 3D image of the sample. S 9220 also has low-vacuum scanning capability, which allows for imaging faster than high-vacuum scanning and reduced risk of charging effects on insulating materials. The microscope also features variable pressure operation, allowing for variable observing pressure up to 5 Torr. This is important when observing samples that would otherwise be damaged by a vacuum environment. S9220 also has a number of additional features, such as enhanced image resolution, improved specimen stage movement and X/Y nanometer accuracy. The machine also has an automated alignment function, allowing for fast and easy sample placement without the need for manual adjustment. All of the features of S-9220 make it a highly capable, efficient scanning electron microscope, suitable for use in a wide variety of scientific research and industrial applications. It's ideal for observing and analysing samples at the nanoscale, and provides high resolution images, with minimal sample preparation. HITACHI S 9220 is a powerful tool, and can help researchers and engineers gain an invaluable insight into their materials.
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