Used HITACHI S-9260A #293591983 for sale
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ID: 293591983
Wafer Size: 8"
Critical Dimension Scanning Electron Microscope (CD-SEM), 8".
HITACHI S-9260A is a powerful scanning electron microscope (SEM) designed to provide high-resolution imaging along with an extensive range of automated controls to improve ease of use. It is equipped with a field emission gun (FEG) electron source and a three-axis positioning stage for greater imaging flexibility and improved contrast. The microscope employs a high-throughput digital imaging system to provide high-resolution digital images. It also features a digital control for convenience and accuracy that allows for precise alignment when imaging specimens. HITACHI S 9260A operates in both high and low vacuum modes, allowing for observation of both conductive and non-conductive samples in a variety of conditions. It is capable of detecting and imaging both SE and BSE signals, enhancing the observations of sample compositions and surface topographies. Similarly, the instrument's SE2 detector and taper unit allows users to perform energy-dispersive X-ray spectroscopy (EDS) on the sample, providing additional elemental analysis capabilities. S-9260 A is further equipped with a range of automated features for greater ease-of-use. This includes a fully automated sample exchange system, auto-set of beam spot size and shape, image stitching, advanced image alignment, and specialized macro functions for automation of tasks such as sample preparation and stage alignment. Additionally, the microscope is provided with a comprehensive suite of software applications, allowing users to analyze, store and share data, such as point and line profile measurements, tilt offline correction, interpolation processing and creation of 3D images. This software functions are designed to provide comprehensive control of the microscope's operations and capabilities in order to perform advanced, high-quality imaging and analysis tasks. Overall, S-9260A is a feature-rich and powerful scanning electron microscope with a wide range of capabilities and automated controls. Its combination of imaging resolution, automated controls and powerful analysis applications make it a versatile and highly-capable instrument for a diverse range of imaging and analysis tasks.
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