Used HITACHI S-9280 #9200123 for sale

HITACHI S-9280 Scanning Electron Microscope (SEM) is a powerful analytical tool that allows for the detailed study of materials at the nano and microscale. With its advanced electron optics and automated features, it provides outstanding imaging, detection, and measurement capabilities with unmatched levels of resolution. S-9280 SEM utilizes a scanning electron beam to acquire detailed 3D images of the crystalline structure of analysis samples. It is equipped with counter-bias imaging technology, which allows the electron beam to pass through the sample while providing a negative bias of between -500V and -5kV. This enables the acquisition of high-resolution images with improved contrast over conventional SEM systems. HITACHI S-9280 is outfitted with a multi-mode detector that functions as an energy analyzer, producing images based on different properties of the current interaction between the sample and the electron beam. This allows for the analysis of a wide range of materials, including metals, semiconductors, polymers, and ceramics. S-9280 provides highly sensitive elemental composition analysis using Energy Dispersive Spectroscopy (EDS). The EDS unit is mounted on an adjustable sample arm, allowing it to be positioned for optimal performance. Through this system, users can quickly and accurately characterize elemental compositions of samples, with detection limits as low as 10ppm. The low-vacuum table of HITACHI S-9280 is designed for optimal scanning capabilities, and it is capable of operating in either conventional or low-vacuum mode. With its secondary electron detector, users can make use of the low-vacuum mode to acquire higher contrast and resolution images. In order to analyze the structure of selected areas, S-9280 offers a broad range of imaging and measurement capabilities. Through the automated interface, users can measure sample thickness, surface area topography, crystal structure, particle size, and more in a matter of seconds. Additionally, optical images can also be acquired through optional in-column optical components. HITACHI S-9280's advanced control software facilitates operation, enabling users to quickly capture, analyze, and store data. It also allows for the remote control of the instrument, enabling remote access and data sharing. In summary, S-9280 Scanning Electron Microscope is a superior imaging tool with powerful capabilities that enable it to accurately and quickly analyze the structure of samples. Its automated features and functions greatly simplify and accelerate the characterization of different materials, making it an invaluable tool in the field of nano and microscale research.