Used HITACHI S-9300 #9032647 for sale

It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.

ID: 9032647
Vintage: 2001
CD Scanning electron microscope, 8-12" Electron optical system: Electron gun: SCHOTTKY Emission source Electro magnetic lens: 3-Stage electromagnetic lens system with boosting voltage Objective lens: (4) Openings click stop Heated aperture is selectable / Adjustable outside the vacuum Scan coil: 2-Stage electromagnetic deflection Astigmatism correction via an 8-pole electromagnetic coil Magnification: 1000x to > 300000x Field control method: Continuously on for sample discharging at all voltages Wafer imaging ability; Entire surface of 8” (or 12”) wafer Depth of focus: >= 1.0 um at 80000x magnification Resolution: 3 nm (800V) Retarding / Boosting mode Hitachi probe tip Power: 208 V 60 Hz 6 kVA 1 Phase CD Measurement principle: Cursor and line profile measurement Optical microscope system: Image is monochrome CCD Camera Magnification is 110x Wafer imaging: X Coverage from 5 – 295 mm Y Coverage from 5 – 195 mm Notch down Field of view: 1.2 mm Accelerating voltage: 500 V to 1600 V, 10 V steps Probe current: 4~24pA Workstation: Model: HP B180L (9GB) O/S: Unix version HP-UX 10.20 Software version: 14.71 SECS / GEM Communication interface Dual XY HITACHI micro scale DSP Image processing BSE Mode functionality Multipoint measurement function Edge roughness function Automated image archiving function Wafer handling system: (2) Cassette holders / ergo flippers Convertible to 300 mm with conversion kit BRK-287006300 Water chiller unit Main unit: HV Controller Lens PS unit DEF PS Unit Laser receiver unit X-Axis laser unit Laser linear scale cover X-Axis excel precision PCB Y-Axis excel precision PCB STSensor PCB (R) STSensor PCB (R) STSensor PCB (L) Secondary electron detection: SE and BSE electrons Aperture ass'y Ion pump 1, Ion pump 2, Ion pump 3 & controller TMP1, TMP2 & controller Stage controller Display Unit: Display of SEM and OM images, GUI operation screen HP Workstation (B180L) Keyboard & Mouse FDD MO Disk drive System controller ECPU 263 Controller C-820A Controller 4500 COGNEX Controller NMEN Controller SIP Controller PSDISP Controller NSGVA Controller EOCONT Controller NOMAFC Controller STAGE EBSI100 Controller WT EBSI100 Controller EVAC EBSI100 Controller HV EBSI100 Controller AMHSIO Controller Power unit: NIP Board PS CN PCB UPS Unit Main power switch unit ION pump power supply unit Power distribution unit Transformer unit Port 1: Door case EFEM Unit: Robot ass'y Ceramic arm Prealigner Includes: Load port 1 Load port 2 WT Controller Chiller Option: Dry pump Missing parts: Display unit: SIP Board Cognex 4500 board LAN HUB unit HDD Currently de-installed 2001 vintage.
HITACHI S-9300 is a scanning electron microscope (SEM) designed for advanced usage in the field of materials analysis. It offers a wide range of imaging capabilities including high magnification, superior resolution and a variety of ways to make images. HITACHI S9300's electron column is capable of astronomical magnifications up to ×570,000 with a 2.5nm resolution, allowing it to gain insight into areas where traditional optical microscopes are unable to reach. As a result, it can image both large and small structures with extreme clarity, making it ideal for microscopic analysis. The microscope is equipped with a lanthanum hexaboride (LaB6) field emission gun (FEG) and a CS-centered Schottky field emission gun (FE) that but permits higher performance at higher magnifications. Additionally, its multiple-focus setting allows users to switch between any two magnifications while maintaining a fixed focus. The SEM also boasts a comprehensive set of detectors, including a secondary electron detector, a field emission scanning electron detector, an energy dispersive X-ray detector (EDS), a wavelength dispersive X-ray detector (WDS), a monochromatic X-ray detector, and an X-ray fluorescent detector (XRF). This wide array of detectors enable users to more easily acquire data from whatever material they are examining. In addition, the SEM has a variety of preprogrammed imaging modes, such as backscattered electron imaging (BSE), accelerated voltage contrast imaging (AVM), reflected electron imaging (REI), and several imaging tomography modes. Overall, S 9300 is capable of producing incredibly detailed images of materials at high magnifications, while also having a wide range of detectors and imaging modes. Its features and capabilities make it a valuable tool for anyone looking to investigate the inner workings of materials.
There are no reviews yet