Used HITACHI S-9380 Type II #9198864 for sale

HITACHI S-9380 Type II scanning electron microscope (SEM) is a high-resolution imaging tool used for a variety of applications, from materials science to metallography. The SEM consists of an electron gun, which produces an electron beam, and an image intensifier, which magnifies the image of the sample. The electron beam is passed through a small opening in the sample, called an aperture, to create an image of the sample at very high magnifications. S-9380 Type II offers up to 50,000x magnification of the sample and features a large depth of field, so images of very thin samples can be obtained. Additionally, the high-resolution images produced by the microscope allow for extremely precise measurements of particles and features. The microscope can also be used to perform electron backscatter diffraction (EBSD) analysis, thanks to its large electron beam current and current-energy control. Other features of this microscope include an enhanced quartz coater that produces thin layers for coating samples, as well as a stage tilt control that allows for the observation of inclined surfaces. It also includes a high-resolution camera built with 1024x1024 pixels to capture sharp images, and three automated stages that facilitate sample analysis. In addition, the microscope has a contrast control unit, which allows users to adjust the amount of contrast in an image to enhance visibility. HITACHI S-9380 Type II is designed for efficient and reliable operation, and features a digital monitor that displays the various images taken by the microscope. It is equipped with an intuitive control panel that makes operation simple and intuitive, even for the novice user. Overall, S-9380 Type II is an advanced scanning electron microscope that allows users to accurately examine and analyze a variety of materials at very high magnification. By providing high-resolution images, high depth of field, and contrast control, the microscope allows users to perform a wide range of tasks that require precise measurements and detailed analysis.