Used HITACHI S-9380 Type II #9198865 for sale

HITACHI S-9380 Type II
ID: 9198865
Wafer Size: 12"
Vintage: 2007
Critical Dimension Scanning Electron Microscope (CD SEM), 12" 2007 vintage.
HITACHI S-9380 Type II is a scanning electron microscope (SEM) that uses a high energy imaging and analytical technique to produce a magnified image of a sample. The imaging equipment consists of an electron gun, lenses, and detectors that are used to detect the electrons emitted from the sample surface under electron bombardment. The electron gun is an electron emitter that produces the electrons needed for scanning the sample surface for imaging. Lenses are then used to focus the electrons onto the sample surface, forming a beam. Finally, the detectors collect the electrons back-scattered from the sample and are used to form the images. The primary application of an SEM is for imaging and measuring samples at higher magnifications than optical microscopes can offer. S-9380 Type II has a standard magnification range of up to 0.5 nm, and a maximum magnification of 10,000X. With this increased resolution, the system is able to detect much smaller features and higher resolution imaging than traditional optical microscopes. The unit also provides a variety of imaging techniques that allow for the visualization of samples at different levels of detail. This includes the use of secondary electron (SE) imaging, BSE imaging, and high angle annular dark field scanning, as well as the incorporation of energy dispersive spectroscopy (EDS) technology. The machine has a working distance of 8 mm and can accommodate samples up to 48mm in diameter. It features a 3-axis encoder tool for sample positioning and a digital autofocus asset. The model also includes a variety of software features such as 3D measurement, 3D tomography, and precision characterization software. In addition, HITACHI S-9380 Type II is capable of low vacuum and variable pressure imaging, enabling the user to study samples in real-time at atmospheric or vacuuming pressure. This is a useful feature for measuring surfaces that are sensitive to the effects of atmospheric pressure, as well as for studying the finer details of a sample's surface. Overall, S-9380 Type II is a powerful scanning electron microscope capable of imaging and characterizing samples with exceptional accuracy and detail. It provides a variety of imaging techniques, as well as unique features such as low vacuum and variable pressure imaging, making it an ideal choice for a variety of research applications.
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