Used HITACHI S-9380 Type II #9243636 for sale
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ID: 9243636
Wafer Size: 12"
Vintage: 2007
Critical Dimension Scanning Electron Microscopes (CD SEM), 12"
2007 vintage.
HITACHI S-9380 Type II scanning electron microscope is a reliable, high-resolution tool for imaging and analyzing a variety of materials at the nanoscale. This advanced instrument combines advanced sample preparation techniques with powerful imaging capabilities in order to provide a comprehensive and versatile platform for handling both hard and soft samples. S-9380 Type II is equipped with a high-energy SEM column that is capable of accelerating electrons up to an energy of 30 kV. This powerful column enables the equipment to generate higher resolution images compared to those achieved by traditional SEM instruments. Additionally, the system is equipped with an energy dispersive X-ray spectrometer, which allows the user to precisely measure and identify the elemental composition of a sample. HITACHI S-9380 Type II is also equipped with a high-resolution scanning electron detector, which is able to collect images at resolutions up to 5 nm. This high-quality imaging unit is ideal for accurately identifying small particles and even subcellular structures in a sample. Furthermore, the machine enables a variety of surface analysis techniques, such as secondary ion mass spectrometry and atomic force microscopy. These analytical techniques allow the user to understand and analyze the properties and chemical composition of a material on the nanoscale. Moreover, S-9380 Type II provides users with a dedicated sample manipulation tool. This asset allows the user to prepare thin-film and other delicate samples with great precision and accuracy. Furthermore, the model provides the user with a simple solution for sample transport and exchange using a computer-controlled stage. In summary, HITACHI S-9380 Type II is a high-quality scanning electron microscope equipment that provides users with a well-rounded platform for imaging and analyzing a wide range of materials at the nanoscale. This advanced system is equipped with a powerful SEM column, a high-resolution detector, and numerous sample preparation and analysis capabilities to ensure a comprehensive and versatile research and imaging experience.
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