Used HITACHI S-9380 Type II #9243637 for sale
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ID: 9243637
Wafer Size: 12"
Vintage: 2005
Critical Dimension Scanning Electron Microscope (CD SEM), 12"
2005 vintage.
HITACHI S-9380 Type II is a scanning electron microscope (SEM), a type of electron microscope that uses a focused electron beam to scan a specimen, generating a variety of signals that contains information about the surface structure, composition and other properties of the sample. This type of microscope is widely used in scientific research, materials analysis and other applications. S-9380 Type II is an advanced, high-resolution microscopy system capable of acquiring images with nanoscale resolution. It features a monochromatic field emission gun (FEG), a low-emittance electron source that provides high brightness and continuous scanning. The column design features magnetic lenses which enable electron optics adjustments, along with a reduced pressure of 5.5×10-5 Pa. As a result, it offers superior imaging parameters to compare with other lower-cost SEMs. The advanced SEM also includes a high-performance thermoelectron detector system, with a stigmatic and non-stigmatic chamber and four detectors to generate signals. The two stigmatic detectors measure secondary and back scattered electrons, providing both spatial and 3-dimensional information. The large-area secondary electron detector with a φ60 mm objective lens, captures secondary electrons with high gathering efficiency to extend the depth of observation. The other two detectors measure the x-ray or Auger signal and the signal of secondary electrons as they emerge from the specimen surface. This SEM model also features a high-sensitivity and wide-range Be Sample Chamber that enables specimens to be handled with high precision. This chamber is integrated with a specimen stage and an auto-stigilation adjustment system for reliable imaging. The vacuum chamber design is equipped with an efficient cryopump, resulting in up to 9 minutes of observation time without specimen drift. The intuitive user interface of the HIACHI HITACHI S-9380 Type II enables users to manage the instrument in a fast and efficient manner. The visual display includes a wide viewing field with a bright LCD monitor and touch panel controller, providing real-time images of the specimen being observed. Utilizing cutting-edge technology, S-9380 Type II SEM is an ideal choice for research labs, medical centers or industrial applications looking to customize and optimize the results of their electron microscopy. This advanced instrument provides high resolution imaging, low electron noise and excellent signal to noise ratio, making it an invaluable tool for professional analysis and quality control.
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